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テラヘルツ波分光測定装置及び方法、非線形光学結晶の検査装置及び方法
专利权人:
アークレイ株式会社
发明人:
北村 茂
申请号:
JP20130168673
公开号:
JP6139327(B2)
申请日:
2013.08.14
申请国别(地区):
日本
年份:
2017
代理人:
摘要:
When light beams of two different wavelengths applied from an excitation light source (14) are made incident on a nonlinear optical crystal (12) having a unique nonlinear coefficient, the nonlinear optical crystal generates THz waves resulting from difference frequency generation according to the nonlinear coefficient that the crystal itself has and SHG waves in which the light beams of two different wavelengths have been wavelength converted in accordance with the nonlinear coefficient. The generated THz waves pass through or are reflected from a sample and are detected by a THz detector (20). The SHG waves are detected by a SHG detector (22). A control unit (24) acquires THz measurement values T from the THz detector, acquires SHG measurement values S from the SHG detector, and uses baseline THz measurement values TB and baseline SHG measurement values SB acquired without the sample to perform baseline correction using (T/S)/(TB/SB).
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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