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光学測定装置および発光素子の波長測定方法
专利权人:
豊田合成株式会社
发明人:
佐藤 友祐,面家 英樹,道家 佐登士
申请号:
JP20140090723
公开号:
JP6079693(B2)
申请日:
2014.04.24
申请国别(地区):
日本
年份:
2017
代理人:
摘要:
PROBLEM TO BE SOLVED: To provide an optical measuring device that measures a wavelength by synchronizing a light measurement unit including a CCD operating at a predetermined exposure cycle with a light emission unit, and provide a wavelength measurement method of a light-emitting element.SOLUTION: An optical measuring device 1 comprises a signal generation unit 310 which, when a CCD 220 receives a first measurement trigger M1a in a first measurement period E1a, generates a voltage application trigger V1a at a first time of a second measurement period E2a, and generates a second measurement trigger M2a at a start time of a third measurement period E3a. Upon reception of the voltage application trigger V1a, a voltage application unit 130 starts to apply a voltage to a light-emitting element L1. Upon reception of the second measurement trigger M2a, the CCD 220 starts exposure and detects light in the third measurement period E3a. The first time of the second measurement period E2a is earlier than the start time
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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