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銅箔の表面状態の評価装置、銅箔の表面状態の評価プログラム及びそれが記録されたコンピュータ読み取り可能な記録媒体、並びに、銅箔の表面状態の評価方法
专利权人:
JX金属株式会社
发明人:
新井 英太,三木 敦史,新井 康修,中室 嘉一郎
申请号:
JP20120250744
公开号:
JP6140429(B2)
申请日:
2012.11.14
申请国别(地区):
日本
年份:
2017
代理人:
摘要:
PROBLEM TO BE SOLVED: To efficiently and accurately evaluate visibility of a transparent base material.SOLUTION: A visibility evaluation device 10 comprises: photographing means 11 that photographs a mark 16 existing beneath a transparent base material 17 over the transparent base material 17; observation point-brightness graph preparation means that measures brightness for each observation point along a direction orthogonal to an extension direction of the observed mark 16 for an image captured by photographing, and prepares an observation point-brightness graph; and visibility evaluation means that evaluates visibility of a transparent base material 15 by a brightness curve produced from an end part of the mark 16 over to a part thereof where the mark 16 does not exist in the observation point-brightness graph. The visibility evaluation means evaluates the visibility, using a difference &Dgr;B(&Dgr;B=Bt-Bb) between a top average value Bt of the brightness curve produced from the end part of the mark to the
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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