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試験装置及びその校正方法
专利权人:
アンリツ株式会社
发明人:
山下 紘司,菅野 博文,大谷 暢,大嶋 真一郎
申请号:
JP20140189022
公开号:
JP6259742(B2)
申请日:
2014.09.17
申请国别(地区):
日本
年份:
2018
代理人:
摘要:
According to one embodiment, a testing device includes a signal generator that generates a first signal output to a device under test, a channel selector provided after the signal generator and configured to select one of a plurality of channels, a signal receiver that receives the second signal supplied from the device under test, a correction value calculator that calculates a correction value for calibrating loss of a respective one of the channels, wherein the correction value calculator calculates a correction value for calibrating loss of a respective one of the channels included in the channel selector, based on a signal level received by the signal receiver via a loopback channel, when a calibration-level output state indicating a state where a signal level of the first signal generated by the signal generator reaches a predetermined transmission reference level of calibration is assumed.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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