微小粒子測定装置におけるラミナーフローモニタリング方法と微小粒子分析方法及び微小粒子測定装置

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专利权人:

ソニー株式会社

发明人:

新田 尚

申请号：

JP20140529338

公开号：

JP6274104(B2)

申请日:

2013.06.05

申请国别(地区):

日本

年份:

2018

代理人:

摘要：

There is provided a laminar flow monitoring method in a fine particle measurement device, the method including a radiation step of radiating light to a laminar flow, a position detection step of receiving, by a detector, an S polarized component which is separated from scattered light produced from the laminar flow and to which astigmatism is given and acquiring light reception position information of the S polarized component in the detector, and a determination step of determining a state of the laminar flow based on the light reception position information.

来源网站：

中国工程科技知识中心

来源网址：

http://www.ckcest.cn/home/