PROBLEM TO BE SOLVED: To provide a novel technology on a slit lamp microscope for observing various illumination positions of slit light in various observation directions.SOLUTION: A slit lamp microscope includes an illumination system, a fixation system, and an imaging system. The illumination system includes a slit light generation part. The slit light generation part generates slit light in which at least one of an illumination position and an illumination angle with respect to the eye to be examined can be changed. The illumination system illuminates the eye to be examined with the slit light. The fixation system projects a fixation target whose projection position with respect to the eye to be examined can be changed, to the eye to be examined. The imaging system guides the return light of the slit light from the eye to be examined to an imaging device.SELECTED DRAWING: Figure 2COPYRIGHT: (C)2017,JPO&INPIT【課題】様々な観察方向から様々な細隙光の照明位置を観察するための細隙灯顕微鏡の新たな技術を提供する。【解決手段】細隙灯顕微鏡は、照明系と、固視系と、撮影系とを含む。照明系は、細隙光生成部を含む。細隙光生成部は、被検眼に対する照明位置および照明角度のうち少なくとも一方が変更可能な細隙光を生成する。照明系は、被検眼を細隙光で照明する。固視系は、被検眼に対する投影位置が変更可能な固視標を被検眼に投影する。撮影系は、被検眼からの細隙光の戻り光を撮像装置に導く。【選択図】図2
