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Semiconductor X-ray detector
专利权人:
シェンゼン・エクスペクトビジョン・テクノロジー・カンパニー・リミテッド
发明人:
カオ、ペイヤン,リウ、ユルン
申请号:
JP2017554401
公开号:
JP6554554B2
申请日:
2015.04.07
申请国别(地区):
JP
年份:
2019
代理人:
摘要:
Disclosed herein is an apparatus suitable for detecting X-ray, comprising: an X-ray absorption layer comprising an electrode; an electronics layer, the electronics layer comprising: a substrate having a first surface and a second surface, an electronics system in or on the substrate, an electric contact on the first surface, and a first via extending from the first surface toward the second surface; wherein the electrode is electrically connected to the electric contact; wherein the electronics system comprises a controller connected in series with and between the electric contact and the first via.
来源网站:
中国工程科技知识中心
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http://www.ckcest.cn/home/

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