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Semiconductor X-ray Detector
专利权人:
LTD.;SHENZHEN XPECTVISION TECHNOLOGY CO.
发明人:
Peiyan CAO
申请号:
US15122449
公开号:
US20180017685A1
申请日:
2015.04.07
申请国别(地区):
US
年份:
2018
代理人:
摘要:
An apparatus for detecting X-ray, comprising: an X-ray absorption layer comprising an electrode; a first voltage comparator configured to compare a voltage of an electrode to a first threshold; a second voltage comparator configured to compare the voltage to a second threshold; a counter configured to register a number of X-ray photons absorbed by the X-ray absorption layer; a controller; the controller is configured to start a time delay from a time at which the first voltage comparator determines that an absolute value of the voltage equals or exceeds an absolute value of the first threshold; the controller is configured to activate the second voltage comparator during the time delay; the controller is configured to cause the number registered by the counter to increase by one, if, during the time delay, the second voltage comparator determines that an absolute value of the voltage equals or exceeds an absolute value of the second threshold.
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中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/
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