SEMICONDUCTOR X-RAY DETECTOR

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专利权人:

LTD.;SHENZHEN XPECTVISION TECHNOLOGY CO.

发明人:

CAO, Peiyan

申请号：

SG11201707507R

公开号：

SG11201707507RA

申请日:

2015.04.07

申请国别(地区):

SG

年份:

2017

代理人:

摘要：

Disclosed herein is an apparatus for detecting X-ray. The apparatus has an X-ray absorption layer with an electrode, one or more voltage comparators configured to compare a voltage of the electrode to one or more thresholds, a counter configured to register the number of X-ray photons absorbed by the X-ray absorption layer, and a controller.

来源网站：

中国工程科技知识中心

来源网址：

http://www.ckcest.cn/home/