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Direct conversion X-ray detector, CT system, and associated procedure
专利权人:
发明人:
Thorsten Ergler,Edgar Göderer,Björn Kreisler,Mario Reinwand,Christian Schröter
申请号:
US14609621
公开号:
US09750467B2
申请日:
2015.01.30
申请国别(地区):
US
年份:
2017
代理人:
摘要:
A direct conversion X-ray detector for the detection of X-rays includes at least a semiconductor used for detecting X-rays, which has areas that are shaded against X-rays and unshaded areas, a pixelated electrode attached to the semiconductor and an all-over electrode attached to the semiconductor opposite the pixelated electrode, and at least one light source to illuminate the all-over electrode with additional light radiation for the purpose of generating additional charge carriers. In an embodiment, the at least one light source is designed such that the shaded areas are irradiated with a different intensity of the additional light radiation than are the unshaded areas. A CT system including the direct conversion X-ray detector is also disclosed, together with a method for the detection of incident X-rays via direct conversion X-ray detector, wherein the shaded areas are irradiated with a different intensity of the additional light radiation than the unshaded areas.
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http://www.ckcest.cn/home/
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