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DUAL-ENERGY DIFFERENTIAL PHASE-CONTRAST IMAGING
专利权人:
Koninklijke Philips N.V.
发明人:
MARTENS, Gerhard (NL),МАРТЕНС Герхард (NL),VAN STEVENDAAL, Udo (NL),ВАН СТЕВЕНДАЛ Удо (NL),MARTENS, Gerhard,МАРТЕНС Герхард,VAN STEVENDAAL, Udo,ВАН СТЕВЕНДАЛ Удо
申请号:
RU2017111808
公开号:
RU0002662074C1
申请日:
2016.08.26
申请国别(地区):
RU
年份:
2018
代理人:
摘要:
FIELD: medicine.SUBSTANCE: group of inventions relates to medical technology, namely to means of X-ray imaging. X-ray imaging apparatus comprises an X-ray source (XR), an X-ray detector (D), an interferometer (IF) located between the X-ray source (XR) and the detector (D), interferometer comprising at least one interferometric diffraction grating (G1), structure of which is tilted about a first axis perpendicular to the optical axis of said imaging apparatus, wherein at least one diffraction grating (G1) is thereby capable of orienting at various angles of inclination with respect to said first axis, at least one additional diffraction grating of source (G0) located between interferometric grating (G1) and the X-ray source, wherein source grating structure (G0) is configured to convert the emitted X-ray radiation into X-ray radiation with increased coherence, adapter mechanism (SGC) of the diffraction grating to adapt the effective grating pitch to grating (G0) of the source and/or with respect to interferometer (IF), wherein grating adapter mechanism (SGC) operates with respect to diffraction grating (G0) of the source, to i) substitute structure (G0, G01) of diffraction grating of the source to a new diffraction grating structure of the source having a step different from the step of diffraction grating (G0) of the source, or ii) at least combine said source diffraction grating structure (G0, G01) with another source grating structure (G02) having a different pitch from source diffraction grating (G0) so as to compensate for the change in the effective path length caused by any of these inclination angles through the space between source diffraction grating (G0, G01) and interferometer (IF). Method of operation of the apparatus includes receiving (S10) a description of the design energy for the X-ray imaging apparatus, and in response to a specific design energy, the slope (S20) of said diffraction grating around the first axis. Computer-readable medium is used to
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