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INTERLEAVED PHOTON DETECTION ARRAY FOR OPTICALLY MEASURING A PHYSICAL SAMPLE
专利权人:
Kendall Research Systems; LLC
发明人:
Christian T. Wentz
申请号:
US16269520
公开号:
US20190239753A1
申请日:
2019.02.06
申请国别(地区):
US
年份:
2019
代理人:
摘要:
An interleaved photon detection array for sampling a physical sample including a plurality of photon detectors, which may be arranged in close proximity to each other. Photon detection array includes at least a first photon detector having at least a first signal detection parameter. Interleaved photon detection array includes at least a second photon detector having at least a second signal detection parameter. Signal detection parameters of the first signal detector and the second signal detector may be heterogenous. Interleaved photon detection array includes a control circuit coupled to the plurality of photon detectors. Control circuit receives signals from the plurality of photon detectors and renders an image of a physical sample. Additional imaging technology such as ultrasound may be combined with photon detection array.
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中国工程科技知识中心
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http://www.ckcest.cn/home/

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