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GAIT PATTERN ANALYSIS FOR PREDICTING FALLS
专利权人:
发明人:
Babak Ziaie,Albert Kim,Junyoung Kim,Shirley Rietdyk
申请号:
US15799557
公开号:
US20180064370A1
申请日:
2017.10.31
申请国别(地区):
US
年份:
2018
代理人:
摘要:
A method for acquiring gait parameters of an individual is disclosed. The method includes capturing calibration images from foot marker placed on feet or shoes of an individual while an individual is standing still, the calibration images are obtained from a camera worn by the individual, capturing subsequent time-varying images from the foot markers while the individual is walking, and comparing the calibration images to the subsequent time-varying images by a processing unit that is coupled to the camera to determine changes between the initial relative image size of the foot markers and the time-varying images of the foot markers as a function of time to analyze gait of the individual.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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