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X-ray imaging apparatus and X-ray imaging method
专利权人:
株式会社日立製作所
发明人:
米山 明男
申请号:
JP2007168095
公开号:
JP5273955B2
申请日:
2007.06.26
申请国别(地区):
JP
年份:
2013
代理人:
摘要:
The present invention provides an X-ray phase-contrast imaging system and method capable of performing time-resolved observation in a short measurement time at the same density resolution and in the same dynamic range as those for a diffraction enhanced X-ray imaging method, and also capable of observing a sample with high sensitivity even if the intensity of an incident X-ray varies with time. A refraction angle of X-ray beams caused by the sample is detected at a time by X-ray imagers by utilizing Laue-case X-ray diffraction by multiple analyzer crystals.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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