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PROCÉDÉ D'IMAGERIE PAR CONTRASTE DE PHASE AUX RAYONS X, FONDÉ SUR DES RÉSEAUX DE DIFFRACTION, EN UNE SEULE ÉTAPE ET N'EXIGEANT QUE DE FAIBLES DOSES
专利权人:
Institute Of High Energy Physics;Paul Scherrer Institut
发明人:
申请号:
EP10703260.9
公开号:
EP2400891B1
申请日:
2010.02.03
申请国别(地区):
EP
年份:
2017
代理人:
摘要:
Phase sensitive X-ray imaging methods provide substantially increased contrast over conventional absorption based imaging, and therefore new and otherwise inaccessible information. The use of gratings as optical elements in hard X-ray phase imaging overcomes some of the problems impairing the wider use of phase contrast in X-ray radiography and tomography. To separate the phase information from other contributions detected with a grating interferometer, a phase-stepping approach has been considered, which implies the acquisition of multiple radiographic projections. Here, an innovative, highly sensitive X-ray tomographic phase contrast imaging approach is presented based on grating interferometry, which extracts the phase contrast signal without the need of phase stepping. Compared to the existing phase step approach, the main advantage of this new method dubbed “reverse projection” is the significantly reduced delivered dose, without degradation of the image quality.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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