您的位置: 首页 > 农业专利 > 详情页

Low dose single step grating based X-ray phase contrast imaging
专利权人:
Institute of High Energy Physics;Paul Scherrer Institut
发明人:
Zhu, Peiping,Wu, Ziyu,Stampanoni, Marco
申请号:
AU2010210169
公开号:
AU2010210169B2
申请日:
2010.02.03
申请国别(地区):
AU
年份:
2015
代理人:
摘要:
Phase sensitive X-ray imaging methods can provide substantially increased contrast over conventional absorption based imaging, and therefore new and otherwise inaccessible information. The use of gratings as optical elements in hard X-ray phase imaging overcomes some of the problems that have impaired the wider use of phase contrast in X-ray radiography and tomography. So far, to separate the phase information from other contributions detected with a grating interferometer, a phase-stepping approach has been considered, which implies the acquisition of multiple radiographic projections. Here, an innovative, highly sensitive X-ray tomographic phase contrast imaging approach is presented based on grating interferometry, which extracts the phase contrast signal without the need of phase stepping. Compared to the existing phase step approach, the main advantage of this new method dubbed "reverse projection" is the significantly reduced delivered dose, without degradation of the image quality. The new technique sets the pre-requisites for future fast and low dose phase contrast imaging methods, fundamental for imaging biological specimens and in-vivo studies.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

意 见 箱

匿名:登录

个人用户登录

找回密码

第三方账号登录

忘记密码

个人用户注册

必须为有效邮箱
6~16位数字与字母组合
6~16位数字与字母组合
请输入正确的手机号码

信息补充