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Tilted-grating approach for scanning-mode X-ray grating interferometry
专利权人:
PAUL SCHERRER INSTITUT
发明人:
Carolina Arboleda,Marco Stampanoni,Zhentian Wang
申请号:
US15309222
公开号:
US10433799B2
申请日:
2015.02.25
申请国别(地区):
US
年份:
2019
代理人:
摘要:
Among the existent X-ray phase-contrast modalities, grating interferometry appears as a promising technique for commercial applications, since it is compatible with conventional X-ray tubes. However, since applications such as medical imaging and homeland security demand covering a considerable field of view, the fabrication of challenging and expensive large-area gratings would be needed. A scanning setup is a good solution, because it uses cheaper line detectors instead of large-area 2D detectors and would require smaller gratings. In this setup, the phase-retrieval using the conventional phase-stepping approach would be slow, so having a faster method to record the signals becomes fundamental. To tackle this problem, a scanning-mode grating interferometer configuration is used, in which a grating is tilted to form Moire fringes perpendicular to the grating lines. The sample is then translated along the fringes, so each line detector records a different phase step for each slice of the sample.
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