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X-ray radiography system for differential phase contrast imaging of an object under investigation using phase-stepping
专利权人:
Siemens Aktiengesellschaft
发明人:
Marcus Radicke
申请号:
US13973156
公开号:
US09453803B2
申请日:
2013.08.22
申请国别(地区):
US
年份:
2016
代理人:
摘要:
An X-ray radiography system for differential phase contrast imaging of an object under investigation by phase-stepping is provided. The X-ray radiography has an X-ray emitter for generating a beam path of quasi-coherent X-ray radiation, an X-ray image detector with pixels arranged in a matrix, and a diffraction or phase grating, in which the X-ray emitter has an X-ray tube with a cathode and an anode. The X-ray tube is constructed in such a way that an electron ray beam originating from the cathode is associated with focusing electronics which produce, from electrons which are incident on an anode, at least one linear-shaped electron fan beam.
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