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CHARGED PARTICLE STATE DETERMINATION APPARATUS AND METHOD OF USE THEREOF
专利权人:
W. Davis Lee
发明人:
W. Davis Lee,Stephen L. Spotts,Susan L. Michaud
申请号:
US15167617
公开号:
US20160271424A1
申请日:
2016.05.27
申请国别(地区):
US
年份:
2016
代理人:
摘要:
The invention comprises a system for determining the state of a charged particle beam, such as beam position, intensity, and/or energy. For example, the charged particle beam state is determined at or about a patient undergoing charged particle cancer therapy using one or more film layers designed to emit photons upon passage of a charged particle beam, which yields information on position and/or intensity of the charged particle beam. The emitted photons are used to calculate position of the treatment beam in imaging and/or during tumor treatment. Optionally and preferably, updating a tomography map uses the same hardware with the same alignment used for cancer therapy at proximately the same time.
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