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Honeycomb structure defect inspection device and honeycomb structure defect inspection method
专利权人:
NGK Insulators, Ltd.
发明人:
Koketsu, Naoto,Kashiwagi, Nobuyuki,Nishio, Akifumi
申请号:
EP20100250534
公开号:
EP2233908(B1)
申请日:
2010.03.22
申请国别(地区):
欧洲专利局
年份:
2018
代理人:
摘要:
A honeycomb structure defect inspection device 1 includes a defect detection means 2 for introducing a detection medium 21 into cells 12 from one end face 15a of a honeycomb structure while applying a pressure for passing the medium 21 through cells 12 and detecting the medium 21 passed through cells 12 and discharged from the other end face 15b to identify a cell 12 having the defect in its partition wall 13 from the dynamic state of the detection medium 21; and a covering means of an outer peripheral wall of the honeycomb structure so as to maintain the pressure to cause the medium 21 to flow toward the other end face 15b while suppressing the leakage of the pressure from the outer peripheral wall 14 and to sufficiently keep the discharge of the medium 21 from cells having no defect in its partition walls 13.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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