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DEFECT INSPECTION METHOD AND DEFECT INSPECTION DEVICE FOR HONEYCOMB FILTER
专利权人:
SUMITOMO CHEMICAL CO LTD
发明人:
申请号:
JP20100230595
公开号:
JP2012083258(A)
申请日:
2010.10.13
申请国别(地区):
日本
年份:
2012
代理人:
摘要:
<p><P>PROBLEM TO BE SOLVED: To provide a defect inspection method and a defect inspection device for a honeycomb filter capable of an inspection in a short time. <P>SOLUTION: The defect inspection method for a honeycomb filter comprises: a step of supplying gas to one end surface 100b of a honeycomb filter 100 comprising partition walls 112 forming multiple flow paths 110 from the one end surface 100b to the other end surface 100t and sealing parts 114 for closing either end of the multiple flow paths 110; a step of supplying the gas exhausted from the other end surface 100t of the honeycomb filter 100 to a gas receiving member 10 which is arranged so as to face the other end surface 100t and is heated; and a step of measuring temperature distribution of the gas receiving member 10. <P>COPYRIGHT: (C)2012,JPO&INPIT</p>
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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