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DEFECT INSPECTION APPARATUS FOR INSPECTING SHEET-LIKE INSPECTION OBJECT, COMPUTER-IMPLEMENTED METHOD FOR INSPECTING SHEET-LIKE INSPECTION OBJECT, AND DEFECT INSPECTION SYSTEM FOR INSPECTING SHEET-LIKE INSPECTION OBJECT
专利权人:
Kobayashi Hiroaki;Hino Makoto;Miyamoto Keiichi
发明人:
Kobayashi Hiroaki,Hino Makoto,Miyamoto Keiichi
申请号:
US201615202921
公开号:
US2017011502(A1)
申请日:
2016.07.06
申请国别(地区):
美国
年份:
2017
代理人:
摘要:
An apparatus divides a photographed image of a sheet-like inspection object into blocks each of which has a size of a predetermined number of pixels by a predetermined number of pixels, calculates a longitudinal variance based on pixel values in a longitudinal direction in each block and a lateral variance based on pixel values in a lateral direction in the block, determines whether the block is a defect candidate using the longitudinal variance and the lateral variance as sheet-like inspection object defect determination evaluation values, and determines, based on one of a length and an area of the blocks determined as the defect candidates, whether the sheet-like inspection object has defect.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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