CSEM CENTRE SUISSE D'ELECTRONIQUE ET DE MICROTECHNIQUE SA
发明人:
申请号：
EP12190359.5
公开号：
EP2586373B1
申请日:
2012.10.29
申请国别(地区):
EP
年份:
2014
代理人:
摘要：
Embodiments relate to an X-ray interferometer for imaging an object (130) comprising: a phase grating (122) for effecting in correspondence with the phase grating geometry a phase shift to at least a part of X-ray incident onto the phase grating (122)； and an absorption grating (123) for effecting in correspondence with the absorption grating geometry absorption to at least a part of X-ray incident onto the absorption grating (123). The X-ray interferometer may be characterized in that the grating period (P 122 ) of the phase grating (122), and the grating period (P 123 ) of the absorption grating (123) are dimensioned such that a detector (140) for X-rays can be placed at a relatively large distance away from the absorption grating (123) such the phase contrast sensitivity of the image of the object detected by the detector remains substantially unaffected.
