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INTERFEROMETRE POUR IMAGERIE A CONTRASTE DE PHASE QUANTITATIVE ET TOMOGRAPHIE AU MOYEN D'UNE SOURCE DE RAYONS X POLYCHROMATIQUES INCOHERENTS
专利权人:
PAUL SCHERRER INSTITUT
发明人:
申请号:
EP06753957.7
公开号:
EP1887936B1
申请日:
2006.05.30
申请国别(地区):
EP
年份:
2013
代理人:
摘要:
An x-ray interferometer arrangement is disclosed comprising only one phase grating (G1) and one amplitude grating (G2). This interferometer can be used to obtain phase contrast images with a standard x-ray tube. Additionall, the new type of interferometer may use a source consisting of an array of individual sub-sources. Each of the sub-sources is individually coherent but mutually incoherent to the other sub-sources. The array of sub-sources may be generated by placing an array of slits, i.e. an additional amplitude grating (G0) close to the source. Such an arrangement makes it possible to use this type of interferometer with a source that provides no spatial or temporal coherence. The setup can therefore be used with larger sources placed at shorter distance of the detector resulting in higher flux densities and thus shorter exposure times. This is of special importance for tomography which requires to acquire images of an object under many (hundreds) viewing angles.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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