ABSTRACT Embodiments relate to an X-ray interferometer for imaging an object (130) comprising: a phase grating (122) for effecting in correspondence with the phase grating geometry a phase shift to at least a part of X-ray incident onto the phase grating (122) and an absorption grating (123) for effecting in correspondence with the absorption grating geometry absorption to at least a part of X-ray incident onto the absorption grating (123). The X-ray interferometer may be characterized in that the grating period (P122) of the phase grating (122) and the grating period (P123) of the absorption grating (123) are dimensioned such that a detector (140) for X-rays can be placed at a relatively large distance away from the absorption grating (123) such the phase contrast sensitivity of the image of the object detected by the detector remains substantially unaffected. (Figure 1)
