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X-ray phase imaging apparatus
专利权人:
Shimadzu Corporation
发明人:
Satoshi Sano,Taro Shirai,Takahiro Doki,Akira Horiba
申请号:
US15704345
公开号:
US10656103B2
申请日:
2017.09.14
申请国别(地区):
US
年份:
2020
代理人:
摘要:
The X-ray phase imaging apparatus is configured to include an image generation unit that generates an X-ray phase-contrast image based on a phase-contrast between a step curve representing an intensity change of an X-ray when an object is placed between an X-ray source and a phase grating or between a phase grating and an absorption grating and a step curve when no object is placed therebetween, and is configured to obtain a displacement amount of relative positions of a plurality of gratings based on a plurality of step curves.
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中国工程科技知识中心
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