A measurement processing device used for an x-ray inspection apparatus that detects an x-ray passing through a specimen with a detection unit to sequentially inspect a plurality of specimens on the basis of an acquired transmission image, includes a setting unit for setting a region to be inspected on a portion of the specimen; a determination unit for determining the non-defectiveness of the region to be inspected by using a transmission image of the x-ray that passed through the region to be inspected; a correction unit for performing a correction on the region to be inspected on the basis of a determination result by the determination unit; and a display control unit for displaying the corrected region to be inspected corrected by the correction unit.
