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Method for acquiring image and ion beam apparatus
专利权人:
HITACHI HIGH-TECH SCIENCE CORPORATION
发明人:
Tomokazu Kozakai,Fumio Aramaki,Osamu Matsuda,Kensuke Shiina,Kazuo Aita,Anto Yasaka
申请号:
US15279055
公开号:
US10014157B2
申请日:
2016.09.28
申请国别(地区):
US
年份:
2018
代理人:
摘要:
A method for acquiring an image, in which an image of an image acquiring region is acquired by radiating an ion beam to a sample having a conducting part with a linear edge on a dielectric substrate, includes performing an equal-width scan of the ion beam in a first direction that obliquely intersects the linear edge and sweep in a second direction intersecting the first direction. The ion beam is sequentially scanned in different patterns on different scan regions of parallelogram shape, each of which includes the image acquiring region. Secondary charged particles are detected to generate image data of all the scan regions, and image data of the scan regions are calculated to generate image data of the image acquiring region. The image data of the image acquiring region are synthesized to display the image data of the image acquiring region.
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