THE TRUSTEES OF COLUMBIA UNIVERSITY IN THE CITY OF NEW YORK
发明人:
ENGLUND Dirk R.,TRUSHEIM Matthew E.
申请号：
US201414566059
公开号：
US2015137793(A1)
申请日:
2014.12.10
申请国别(地区):
美国
年份:
2015
代理人:
摘要：
Systems and methods for precision optical imaging of electrical currents and temperature in integrated circuits are disclosed herein. In one aspect of the disclosed subject matter, a method for detecting a characteristic of an integrated circuit can include depositing at least one diamond structure, having at least one color center therein, onto a side of the integrated circuit.
