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Method of measuring sub-micrometer hysteresis loops of magnetic films
专利权人:
NATIONAL YUNLIN UNIVERSITY OF SCIENCE AND TECHNOLOGY
发明人:
WU TE-HO,YE LIN-HSIU,LEE JIA-MOU
申请号:
US20060397608
公开号:
US2006250129(A1)
申请日:
2006.04.05
申请国别(地区):
美国
年份:
2006
代理人:
摘要:
A method of measuring sub-micrometer hysteresis loops of a magnetic film is provided. First, a magnetic field is applied to a sample of a magnetic film, and a polarization microscope is used to observe an analytical area of the sample. Next, the observed dynamic video is converted to many digital pictures stored in chronological order. Then, the grayscale values of each selected pixel are read and converted to the corresponding relative magnetic moments, and hysteresis loops of each selected pixel are drawn.
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