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Grain quality sensor
专利权人:
Appareo Systems; LLC
发明人:
Nicholas L. Butts,Marshall T. Bremer,Jonathan L. Tolstedt
申请号:
US14853971
公开号:
US09756785B2
申请日:
2015.09.14
申请国别(地区):
US
年份:
2017
代理人:
摘要:
A grain quality sensor comprising a lens, a filter, a photosite array, an illumination source, and an electronics module, wherein the illumination source directs light containing a known set of wavelengths onto a crop sample, wherein the lens picks up light reflected by the crop sample and directs it into the filter, which allows light to pass into different parts of the photosite array such that certain locations on the photosite array only get certain frequencies of the reflected light, wherein the electronics module is electrically connected to the photosite array and capable of determining which parts of the photosite array received light and what frequency the light received was, wherein the electronics module can analyze the optical data received by the photosite array, and wherein the analysis of the optical data is used to determine the composition of different parts of the crop sample.
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