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Crop quality sensor based on specular reflectance
专利权人:
Appareo Systems; LLC
发明人:
Marshall T. Bremer,Nicholas L. Butts
申请号:
US14853978
公开号:
US09723784B2
申请日:
2015.09.14
申请国别(地区):
US
年份:
2017
代理人:
摘要:
A crop quality sensor, comprising an illumination source, an imaging device, and a processor executing application software. The illumination source is shone onto a crop sample, and an image is taken with the imaging device of the illuminated crop sample. The software executing on the processor is used to analyze the image to identify the outlines of individual kernels and to identify which of those outlines contain a specular highlight, indicative that the kernel is whole and unbroken, while the absence of such a specular highlight is indicative of a broken kernel.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/
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