STRUCTURE EVALUATION SYSTEM, STRUCTURE EVALUATION DEVICE, AND STRUCTURE EVALUATION METHOD

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专利权人:

Kabushiki Kaisha Toshiba, Inc.;KYOTO UNIVERSITY

发明人:

TAKAMINE, Hidefumi,WATABE, Kazuo,SHIOTANI, Tomoki

申请号：

EP20170707455

公开号：

EP3290915(A1)

申请日:

2017.03.06

申请国别(地区):

欧洲专利局

年份:

2018

代理人:

摘要：

According to an embodiment, a structure evaluation system includes a plurality of sensors, a position locator, and an evaluator. The sensors detect an elastic wave generated from a structure. The position locator derives a source distribution of the elastic waves generated from the structure, caused by an impact on the structure. The evaluator evaluates a state of deterioration of the structure from characteristic parameters of the elastic waves in the source distribution.

来源网站：

中国工程科技知识中心

来源网址：

http://www.ckcest.cn/home/