[Problem to be solved] To provide a charged particle dose simulation device and a charged particle dose simulation method capable of reducing the load of calculating process to calculate the dose distribution in advance while suppressing degradation in precision. [Solution] A simulation device (3) includes an input part (31) which receives an input of simulation data including material information of the irradiation target (X) and irradiation information of a proton beam (B) and an calculation unit (33) which calculates the dose distribution of the proton beam (B) in the irradiation target (X) on the basis of simulation data received by the input part (31) and the dose distribution kernel. Wherein the calculation unit (33) is operated as following: a surface map to the body surface is created by hypothesizing the proton beam (B) reaching a body furface, and the proton beam (B) is refined into a plurality of beamlets (Ba) by refining the surface map. According to the simulation data received by the input part (31) and the plurality of beamlets (Ba), the dose distribution of the proton beam (B) in the irradiation target (X) is calculated.以提供能夠抑制精確度下降的同時,減輕運算處理之負擔來提前算出帶電粒子束之劑量分佈的帶電粒子劑量模擬裝置及帶電粒子劑量之模擬方法為目的。模擬裝置(3):具備:輸入部(31),接收包含被照射體(X)之物質資訊及質子束(B)之照射資訊的模擬資料之輸入;及運算部(33),根據由輸入部(31)接收的模擬資料及劑量分佈核,算出被照射體(X)內的質子束(B)之劑量分佈,其中,運算部(33)如下操作:從假設為到達體表面的質子束(B)製作Surface Map,並且細化Surface Map來將質子束(B)細化為多數個小射束(beamlet)(Ba),根據由輸入部(31)接收的模擬資料和多數個小射束(Ba),算出被照射體(X)內的質子束(B)之劑量分佈。1...質子束治療裝置3...模擬裝置31...輸入部33...運算部35...輸出部51...照射部52...準直器53...填充物5...照射裝置X...被照射體B...質子束Xa...體表面
