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Charged particle dose simulation device, charged particle beam irradiation device, charged particle dose simulation method, and charged particle beam irradiation method
专利权人:
Teiji Nishio
发明人:
Teiji Nishio,Yuusuke Egashira,Manabu Yamada
申请号:
US13267510
公开号:
US08680487B2
申请日:
2011.10.06
申请国别(地区):
US
年份:
2014
代理人:
摘要:
A simulation device includes an input unit which receives an input of simulation data including material information of the irradiation target and irradiation information of a charged particle beam, and an arithmetic unit which calculates the dose distribution of the charged particle beam in the irradiation target on the basis of simulation data received by the input unit and the dose distribution kernel. The arithmetic unit segments the charged particle beam spread to a predetermined range at an intermediate portion in the traveling direction of the charged particle beam, hypothesizes a plurality of virtual shapes having conical spread with a segmented position as a start point, and calculates the dose distribution of the charged particle beam in the irradiation target on the basis of simulation data received by the input unit and a plurality of virtual shapes of the charged particle beam.
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