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X-RAY INSPECTION DEVICE
专利权人:
TOSHIBA IT & CONTROL SYSTEMS CORPORATION
发明人:
CHOUNO, Masami,TSURU, Shoji
申请号:
WO2018JP11217
公开号:
WO2018190092(A1)
申请日:
2018.03.20
申请国别(地区):
世界知识产权组织国际局
年份:
2018
代理人:
摘要:
Provided is an X-ray inspection device whereby it is possible to create an X-ray fluoroscopic image of only a region necessary for reconstruction of a CT image. An image acquiring unit 71 acquires a reference image for determining a field-of-view loss region and an image of a work piece as a trimming object from an X-ray detector 3. An average luminance value calculation unit 72 calculates the average luminance value of an image in which there is no field-of-view loss in the reference image. A field-of-view loss region determination unit 73 determines that pixels having a luminance less than a threshold value for the average luminance value calculated by the average luminance value calculation unit 72 are in a field-of-view loss region for a captured fluoroscopic image. A trimming image acquiring unit 75 acquires an X-ray fluoroscopic image other than in a field-of-view loss region from a captured image of the work piece. A reconstruction processing unit 8 reconstructs a CT image on the basis of the X-ray flu
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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