Nakka John Suman,Kamphuis Tonny,Groenhuis Roelf Anco Jacob
申请号：
US201614994590
公开号：
US2017200646(A1)
申请日:
2016.01.13
申请国别(地区):
美国
年份:
2017
代理人:
摘要：
Integrated circuit dies within a semiconductor wafer are separated using an approach that may facilitate mitigation of warpage, cracking and other undesirable aspects. As may be implemented in accordance with one or more embodiments, a semiconductor wafer is provided with a plurality of integrated circuit dies and first and second opposing surfaces, and with the second surface of the wafer being ground. A first mold compound is applied to the ground second surface, and the integrated circuit dies are separated along saw lanes while using the first mold compound to hold the dies in place. The integrated circuit dies are encapsulated with the mold compounds, by applying the second mold compound to the first surface and along sidewalls of the integrated circuit dies.
