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Gate driving circuit including a temperature detection circuit for reducing switching loss and switching noise
专利权人:
Mitsubishi Electric Corporation
发明人:
Sakai Takuya,Nakatake Hiroshi
申请号:
US201414760928
公开号:
US9608618(B2)
申请日:
2014.01.29
申请国别(地区):
美国
年份:
2017
代理人:
Oblon, McClelland, Maier & Neustadt, L.L.P.
摘要:
A temperature detection circuit for detecting a temperature of a switching element, a current source for causing a forward current to flow to the temperature detection circuit, an amplifier circuit for amplifying a forward voltage of the temperature detection circuit, a current adjustment circuit for adjusting a magnitude of a gate current to the switching element on the basis of an output voltage of the amplifier circuit, and a drive circuit for receiving an external signal and turning ON/OFF the switching element, are included. The magnitude of the gate current caused to flow from the current adjustment circuit to the gate electrode of the switching element is adjusted on the basis of a change in a magnitude of the forward voltage corresponding to a change in the temperature of the temperature detection circuit.
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