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Circuit and method for real-time monitoring of process, temperature, and voltage variations
专利权人:
Microsemi Storage Solutions (U.S.), Inc.
发明人:
Chang Howard Shih Hao
申请号:
US201414510005
公开号:
US9459314(B1)
申请日:
2014.10.08
申请国别(地区):
美国
年份:
2016
代理人:
Letters Patent, LLC `Haszko Dennis R.
摘要:
The present disclosure provides a monitoring system for monitoring the operation of an integrated circuit, the monitoring system comprising: a reference circuit comprising a reference signal delay path and an output for outputting a reference signal; a monitoring circuit, the monitoring circuit comprising: a programmable delay line for providing a controllably selectable delay path; and an output for outputting a delayed signal; a comparison circuit, for comparing the reference signal to the delayed signal and determining whether the error has occurred based on the comparison.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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