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XRF Analyzer with Separate Source and Detector Heat Sinks
专利权人:
Moxtek; Inc.
发明人:
Vincent Floyd Jones,Daniel N. Paas
申请号:
US15936082
公开号:
US20180228009A1
申请日:
2018.03.26
申请国别(地区):
US
年份:
2018
代理人:
摘要:
An XRF analyzer can include an x-ray source and an x-ray detector; an x-ray source heat-sink adjacent a side of the x-ray source; and an x-ray detector heat-sink adjacent a side of the x-ray detector. In one embodiment, the x-ray source heat-sink can be separated from the x-ray detector heat sink by a material having a thermal conductivity of less than 20 W/(m*K). In another embodiment, the x-ray source heat-sink can be separated from the x-ray detector heat sink by at least 3 millimeters of a thermally insulating material. In one embodiment, the x-ray source heat-sink can be separated from the x-ray detector heat sink by a segment of the engine component casing. Separation of the heat sinks can help avoid heat from the x-ray source adversely affecting resolution of the x-ray detector.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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