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自覚式検眼装置及び自覚式検眼プログラム
专利权人:
NIDEK CO LTD
发明人:
TAKII MICHIHIRO,滝井 通浩,HANEBUCHI MASAAKI,羽根渕 昌明,KAWAI NORIJI,河合 規二
申请号:
JP2017069850
公开号:
JP2018038788A
申请日:
2017.03.31
申请国别(地区):
JP
年份:
2018
代理人:
摘要:
PROBLEM TO BE SOLVED: To provide an optometer and a program measuring optical characteristics of the eye to be tested accurately in measuring the optical characteristics of the eye to be tested subjectively.SOLUTION: A subjective optometer which has a correction optical system that is arranged in an optical path of a light discharge optical system projecting an optotype light flux to the eye to be tested and changes optical characteristics of an optotype light flux, is provided with subjective measurement means subjectively measuring optical characteristics of the eye to be tested, and subjectively measures the optical characteristic of the eye to be tested. It is provided with: objective measurement means which emits measurement light to the fundus of the eye to be tested, has a measurement optical system receiving its reflective light, and objectively measures the optical characteristic of the eye to be tested and control means which objectively measures the optical characteristic of the eye to be tested by the objective measurement means while the optical characteristics of the eye to be tested are subjectively measured by the subjective measurement means.SELECTED DRAWING: Figure 1COPYRIGHT: (C)2018,JPO&INPIT【課題】被検眼の光学特性を自覚的に測定する際に、被検眼の光学特性を精度よく測定する検眼装置およびプログラムを提供する。【解決手段】視標光束を被検眼に向けて投影する投光光学系の光路中に配置され、視標光束の光学特性を変化する矯正光学系と、を有し、被検眼の光学特性を自覚的に測定する自覚式測定手段を備え、被検眼の光学特性を自覚的に測定する自覚式検眼装置であって、被検眼の眼底に測定光を出射し、その反射光を受光する測定光学系を有し、被検眼の光学特性を他覚的に測定する他覚式測定手段と、自覚式測定手段によって被検眼の光学特性を自覚的に測定している間に、他覚式測定手段によって被検眼の光学特性を他覚的に測定する制御手段と、を備える。【選択図】図1
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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