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X-RAY INSPECTION APPARATUS AND X-RAY INSPECTION METHOD
专利权人:
Job Corporation
发明人:
YAMAKAWA, Tsutomu,YAMAMOTO, Shuichiro,YAMASAKI, Masashi
申请号:
EP15741002
公开号:
EP3098594A4
申请日:
2015.01.23
申请国别(地区):
EP
年份:
2017
代理人:
摘要:
Foreign matter present inside an object and the like are detected with higher resolution and higher reliability. Frame data of a plurality of tomographic planes that are parallel in the scan direction and set in a space between an X-ray tube (31 and an X-ray detecting unit (22) is generated based on detected frame data. The generation of frame data is performed based on the fan-shaped spreading of an X-ray beam and the differences in position in a height direction between the plurality of tomographic planes from a detection surface. Tomographic images are respectively generated from the frame data of the plurality of tomographic planes based on a laminography technique. Edge information based on the changes in pixel values in each tomographic image is calculated for each pixel. A three-dimensional distribution of the edge information is generated. A search is performed on the edge information in a direction passing through the plurality of tomographic planes. As a result of the search, pixels indicating a maximum value in the edge information are detected. Only pixels in the plurality of tomographic images that positionally correspond to the detected pixels are combined into a single composite image.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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