您的位置: 首页 > 农业专利 > 详情页

X-ray inspection apparatus and X-ray inspection method
专利权人:
Shinji Sugita
发明人:
Shinji Sugita,Noriyuki Kato,Masayuki Masuda,Tsuyoshi Matsunami
申请号:
US13063253
公开号:
US08254519B2
申请日:
2009.08.28
申请国别(地区):
US
年份:
2012
代理人:
摘要:
An X-ray inspection apparatus includes a scanning X-ray source for emitting an X-ray, an X-ray detector drive unit having a plurality of X-ray detectors mounted thereon and being capable of independently driving the plurality of X-ray detectors, and an image acquisition control mechanism for controlling the X-ray detector drive unit and acquisition of image data from the X-ray detectors. The scanning X-ray source emits an X-ray by moving an X-ray focal point position of the X-ray source to each of originating point positions of X-ray emission, which are set for the X-ray detectors such that X-rays are transmitted through a plurality of prescribed inspection areas of an inspection object and enter the X-ray detectors. Image pickup by the X-ray detector and movement of another X-ray detector are concurrently performed in an alternate manner. The image acquisition control mechanism acquires image data, and an operation unit reconstructs an image.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

意 见 箱

匿名:登录

个人用户登录

找回密码

第三方账号登录

忘记密码

个人用户注册

必须为有效邮箱
6~16位数字与字母组合
6~16位数字与字母组合
请输入正确的手机号码

信息补充