This invention provides a goods inspection apparatus using distributed X-ray source, comprising: a frame； a goods passage； a goods conveyor； a distributed X-ray source for producing X-ray at different positions successively within each working cycle； a detector array for receiving the X-ray from the distributed X-ray source and outputting signals indicating the strength of the X-ray； an electronics system for receiving signals from the detectors, converting the signals into digital ones, and forming a data packet with the position numbers of corresponding detectors, outputting a sequence of data packets formed by the position numbers and signals from the plurality of detectors of the detector array； an image processing system for receiving the output from the electronics system, processing the position numbers of detectors and the corresponding signals indicating the strength of X-ray, constructing to form an image of the object under inspection； a ray source power supply for providing power to the distributed X-ray source； and a control system for exercising logical control over the respective parts to enable the respective sub-systems to work in coordination.
