您的位置: 首页 > 农业专利 > 详情页

SYSTÈME D'IMAGERIE PAR RAYONS X À RÉDUCTION D'OBJETS ÉTRANGERS
专利权人:
Koninklijke Philips N.V.
发明人:
申请号:
EP18197207.6
公开号:
EP3628230A1
申请日:
2018.09.27
申请国别(地区):
EP
年份:
2020
代理人:
摘要:
An improved X-ray imaging system. The system comprises an X-Ray radiation source configured to emit an X-ray beam towards an object to be imaged and an X-ray detector configured to detect X-rays which have passed through the object. It further comprises a reconstruction processing means configured to reconstruct an image of the object based on the detected X-rays, wherein the reconstruction processing means is further configured to determining presence of at least one foreign object located in the object or located between a surface of the object and the X-Ray radiation source and/or the X-ray detector, obtaining a three-dimensional profile of the determined foreign object from a server-based foreign object database, and reconstructing an image of the object by acquiring a plurality of projection images of the object from the X-ray detector and reducing impact on image quality of an artefact that can be caused by the foreign object in the image of the object based on at least the obtained three-dimensional profile of the foreign object.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

意 见 箱

匿名:登录

个人用户登录

找回密码

第三方账号登录

忘记密码

个人用户注册

必须为有效邮箱
6~16位数字与字母组合
6~16位数字与字母组合
请输入正确的手机号码

信息补充