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STRUCTURE EVALUATION SYSTEM, STRUCTURE EVALUATION DEVICE, AND STRUCTURE EVALUATION METHOD
专利权人:
Kabushiki Kaisha Toshiba, Inc.;KYOTO UNIVERSITY
发明人:
TAKAMINE, Hidefumi,WATABE, Kazuo,SHIOTANI, Tomoki
申请号:
EP20170707457
公开号:
EP3293517(A1)
申请日:
2017.03.06
申请国别(地区):
欧洲专利局
年份:
2018
代理人:
摘要:
According to an embodiment, a structure evaluation system includes a plurality of AE sensors, a signal processor, a position locator, and an evaluator. The AE sensors detect an elastic wave generated from a structure. The signal processor performs signal processing on the elastic wave detected by the AE sensors and outputs an AE signal including information on the elastic wave. The position locator derives a source distribution indicating the distribution of sources of the elastic wave generated in the structure, using an AE signal caused by an impact on the structure. The evaluator evaluates a state of deterioration of a predetermined region of the structure from a density of the sources of the elastic wave obtained on the basis of the source distribution.
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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