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OPTICAL WAVEGUIDE TYPE MEASUREMENT SYSTEM, MEASUREMENT METHOD, AND OPTICAL WAVEGUIDE TYPE SENSOR CHIP
专利权人:
TOSHIBA CORP
发明人:
申请号:
JP20120011456
公开号:
JP2012215553(A)
申请日:
2012.01.23
申请国别(地区):
日本
年份:
2012
代理人:
摘要:
PROBLEM TO BE SOLVED: To provide an optical waveguide type measurement system in which detection sensitivity of a measurement object material is more improved to higher accuracy, and a measurement method and an optical waveguide type sensor chip thereof. SOLUTION: The optical waveguide type measurement system includes an optical waveguide having a sensing area where first substances that specifically bind to the measurement object material are immobilized; magnetic fine particles in which second substances that specifically bind to the measurement object material are immobilized, and which have magnetism; a magnetic field applying unit for generating a magnetic field that moves the magnetic particles; a light source that makes light incident to the optical waveguide; and a light receiving element for receiving light emitted from the optical waveguide. COPYRIGHT: (C)2013,JPO&INPIT
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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