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光学特性の測定方法及び光学特性の測定装置
专利权人:
国立大学法人山梨大学
发明人:
金 蓮花,近藤 英一
申请号:
JP20140016281
公开号:
JP6273504(B2)
申请日:
2014.01.31
申请国别(地区):
日本
年份:
2018
代理人:
摘要:
PROBLEM TO BE SOLVED: To solve a problem in which, when optical characteristics of a measuring object in a cell are measured, a photoelastic effect of an entrance window and an emission window as optical windows of the cell reduces accuracy in measuring original optical characteristics of the measuring object.SOLUTION: An optical characteristics measuring method includes the steps of: arranging a measuring object in a cell; measuring a Mueller matrix of a system including a window from deflected incident light and emission light obtained through an emission window by radiating the incident light to the measuring object through an entrance window of the cell; acquiring a birefringence phase difference and a main axis azimuth of the entrance window and the emission window from the measured Mueller matrix of the system including the window; acquiring Mueller matrices of the entrance window and the emission window; acquiring a Mueller matrix of the measuring object; and acquiring Ψ indicating an amplitude rat
来源网站:
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