PROBLEM TO BE SOLVED: To allow for easily detecting various types of defects of an object under inspection.SOLUTION: A defect inspection device (1) comprises: a light source unit (3) having a first polarized light emission area (7) and a surface emission area (5)； and a second polarizing unit (4) configured to polarize light (A7), polarized in a first direction and emitted from the first polarized light emission area (7), in a second direction. A space is provided between the light source unit (3) and the second polarizing unit (4) to allow an object (2) under inspection to be inserted.SELECTED DRAWING: Figure 1【課題】被検査物に含まれるさまざまな種類の欠陥を容易に検出する。【解決手段】欠陥検査装置（１）は、第１偏光発光領域（７）および面発光領域（５）を有する光源部（３）と、第１偏光発光領域（７）から出射された第１方向へ偏光された光（Ａ７）を第２方向へ偏光する第２偏光部（４）とを備え、光源部（３）と第２偏光部（４）との間に被検査物（２）を挿入するための空間が設けられている。【選択図】図１
