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AUGER ELECTRON SPECTROSCOPE AND AUGER ELECTRON SPECTROSCOPY
专利权人:
HIGH ENERGY ACCELERATOR RESEARCH ORGANIZATION
发明人:
MASE KAZUHIKO,KOBAYASHI HIDEKAZU
申请号:
JP20040120336
公开号:
JP2005300455(A)
申请日:
2004.04.15
申请国别(地区):
日本
年份:
2005
代理人:
摘要:
PROBLEM TO BE SOLVED: To provide an Auger electron spectroscope which is sufficiently installed at a pipe having an internal diameter of 35 mm and disposed at a Conflat flange having an outer diameter of 70 mm, and especially, which is made compact in its outside diameter, and also to provide Auger electron spectroscopy which uses the spectroscope. SOLUTION: An electron beam is projected from an electron gun 11 onto a sample S to be analyzed, in order to cause Auger electrons to be emitted from the sample S. Then, only Auger electrons AE, having emission polar angles in a range of 26±2 degrees and being selected from the Auger electrons, are introduced into a space between an inner cylindrical electrode 13 and an outside cylindrical electrode 14 arranged so as to surround the electron gun 11 and deflected by a deflection electric field, whereby an analysis is carried out. COPYRIGHT: (C)2006,JPO&NCIPI
来源网站:
中国工程科技知识中心
来源网址:
http://www.ckcest.cn/home/

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